%0 Conference Paper %1 conf/aspdac/SunL15 %A Sun, Shupeng %A Li, Xin %B ASP-DAC %D 2015 %I IEEE %K dblp %P 302-307 %T Fast statistical analysis of rare failure events for memory circuits in high-dimensional variation space. %U http://dblp.uni-trier.de/db/conf/aspdac/aspdac2015.html#SunL15 %@ 978-1-4799-7792-5

@inproceedings{conf/aspdac/SunL15, added-at = {2016-03-09T00:00:00.000+0100}, author = {Sun, Shupeng and Li, Xin}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/24970ce3fde211a2d8bbfa698290cbc1d/dblp}, booktitle = {ASP-DAC}, crossref = {conf/aspdac/2015}, ee = {http://dx.doi.org/10.1109/ASPDAC.2015.7059022}, interhash = {69fcd2ff5a04ea1b46ab32b18a500bb2}, intrahash = {4970ce3fde211a2d8bbfa698290cbc1d}, isbn = {978-1-4799-7792-5}, keywords = {dblp}, pages = {302-307}, publisher = {IEEE}, timestamp = {2016-03-10T11:46:25.000+0100}, title = {Fast statistical analysis of rare failure events for memory circuits in high-dimensional variation space.}, url = {http://dblp.uni-trier.de/db/conf/aspdac/aspdac2015.html#SunL15}, year = 2015 }