%0 Journal Article %1 journals/tcad/SunFDL12 %A Sun, Shupeng %A Feng, Yamei %A Dong, Changdao %A Li, Xin %D 2012 %J IEEE Trans. on CAD of Integrated Circuits and Systems %K dblp %N 12 %P 1831-1844 %T Efficient SRAM Failure Rate Prediction via Gibbs Sampling. %U http://dblp.uni-trier.de/db/journals/tcad/tcad31.html#SunFDL12 %V 31

@article{journals/tcad/SunFDL12, added-at = {2015-01-16T00:00:00.000+0100}, author = {Sun, Shupeng and Feng, Yamei and Dong, Changdao and Li, Xin}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/205e5b971e7099480849b4ef8844790ee/dblp}, ee = {http://dx.doi.org/10.1109/TCAD.2012.2209884}, interhash = {8c2f2ed5e6ae88681ed948d9d5319243}, intrahash = {05e5b971e7099480849b4ef8844790ee}, journal = {IEEE Trans. on CAD of Integrated Circuits and Systems}, keywords = {dblp}, number = 12, pages = {1831-1844}, timestamp = {2016-02-02T10:08:22.000+0100}, title = {Efficient SRAM Failure Rate Prediction via Gibbs Sampling.}, url = {http://dblp.uni-trier.de/db/journals/tcad/tcad31.html#SunFDL12}, volume = 31, year = 2012 }