%0 Journal Article %1 journals/tcad/SunLLLG15 %A Sun, Shupeng %A Li, Xin %A Liu, Hongzhou %A Luo, Kangsheng %A Gu, Ben %D 2015 %J IEEE Trans. on CAD of Integrated Circuits and Systems %K dblp %N 7 %P 1096-1109 %T Fast Statistical Analysis of Rare Circuit Failure Events via Scaled-Sigma Sampling for High-Dimensional Variation Space. %U http://dblp.uni-trier.de/db/journals/tcad/tcad34.html#SunLLLG15 %V 34

@article{journals/tcad/SunLLLG15, added-at = {2016-03-09T00:00:00.000+0100}, author = {Sun, Shupeng and Li, Xin and Liu, Hongzhou and Luo, Kangsheng and Gu, Ben}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/20fb4d06cbd6f0c7681eca07be046ec23/dblp}, ee = {http://dx.doi.org/10.1109/TCAD.2015.2404895}, interhash = {4ff32194293ee38fbac1419d00baa65b}, intrahash = {0fb4d06cbd6f0c7681eca07be046ec23}, journal = {IEEE Trans. on CAD of Integrated Circuits and Systems}, keywords = {dblp}, number = 7, pages = {1096-1109}, timestamp = {2016-03-10T11:39:32.000+0100}, title = {Fast Statistical Analysis of Rare Circuit Failure Events via Scaled-Sigma Sampling for High-Dimensional Variation Space.}, url = {http://dblp.uni-trier.de/db/journals/tcad/tcad34.html#SunLLLG15}, volume = 34, year = 2015 }