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Disambiguation of "Kükner, Halil"

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Comparison of NBTI aging on adder architectures and ring oscillators in the downscaling technology nodes.

, , , , , , , , , , , , , , and . Microprocessors and Microsystems - Embedded Hardware Design, 39 (8): 1039-1051 (2015)

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Modelling and mitigation of time-zero variability in sub-16nm finfet-based STT-MRAM memories., , , , , and . ACM Great Lakes Symposium on VLSI, page 243-244. ACM, (2014)Comparison of NBTI aging on adder architectures and ring oscillators in the downscaling technology nodes., , , , , , , , , and 5 other author(s). Microprocessors and Microsystems - Embedded Hardware Design, 39 (8): 1039-1051 (2015)Impact of duty factor, stress stimuli, gate and drive strength on gate delay degradation with an atomistic trap-based BTI model., , , , , , , and . Microprocessors and Microsystems - Embedded Hardware Design, 37 (8-A): 792-800 (2013)Degradation analysis of datapath logic subblocks under NBTI aging in FinFET technology., , , , , , , , , and . ISQED, page 473-479. IEEE, (2014)The defect-centric perspective of device and circuit reliability - From individual defects to circuits., , , , , , , , , and 5 other author(s). ESSDERC, page 218-225. IEEE, (2015)Bias Temperature Instability analysis of FinFET based SRAM cells., , , , , , and . DATE, page 1-6. European Design and Automation Association, (2014)Bias temperature instability analysis in SRAM decoder., , , , and . ETS, page 1. IEEE Computer Society, (2013)Dynamically variable step search motion estimation algorithm and a dynamically reconfigurable hardware for its implementation., , , and . IEEE Trans. Consumer Electronics, 55 (3): 1645-1653 (2009)Integral impact of BTI and voltage temperature variation on SRAM sense amplifier., , , , , , and . VTS, page 1-6. IEEE Computer Society, (2015)BTI impact on logical gates in nano-scale CMOS technology., , , , and . DDECS, page 348-353. IEEE, (2012)