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Disambiguation of "Weckx, Pieter"

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Integral impact of BTI and voltage temperature variation on SRAM sense amplifier.

, , , , , , and . VTS, page 1-6. IEEE Computer Society, (2015)

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Prof. Dr. Pieter Anne Vermeer University of Stuttgart

 

Other publications of authors with the same name

A brief overview of gate oxide defect properties and their relation to MOSFET instabilities and device and circuit time-dependent variability., , , , , , , , , and 4 other author(s). Microelectronics Reliability, (2018)The defect-centric perspective of device and circuit reliability - From individual defects to circuits., , , , , , , , , and 5 other author(s). ESSDERC, page 218-225. IEEE, (2015)Device Aging : A Reliability and Security Concern, , , , , , , , and . 2018 23RD IEEE European Test Symposium (ETS), IEEE, (2018)Characterization of time-dependent variability using 32k transistor arrays in an advanced HK/MG technology., , , , , , , , , and . IRPS, page 3. IEEE, (2015)Impact of duty factor, stress stimuli, gate and drive strength on gate delay degradation with an atomistic trap-based BTI model., , , , , , , and . Microprocessors and Microsystems - Embedded Hardware Design, 37 (8-A): 792-800 (2013)Impact of random telegraph noise on ring oscillators evaluated by circuit-level simulations., , , , and . ICICDT, page 1-4. IEEE, (2015)Impact of time-dependent variability on the yield and performance of 6T SRAM cells in an advanced HK/MG technology., , , , and . ICICDT, page 1-4. IEEE, (2015)Integral impact of BTI and voltage temperature variation on SRAM sense amplifier., , , , , , and . VTS, page 1-6. IEEE Computer Society, (2015)Comparison of NBTI aging on adder architectures and ring oscillators in the downscaling technology nodes., , , , , , , , , and 5 other author(s). Microprocessors and Microsystems - Embedded Hardware Design, 39 (8): 1039-1051 (2015)Experimental evidences and simulations of trap generation along a percolation path., , , , , , , , , and . ESSDERC, page 226-229. IEEE, (2015)