%0 Journal Article %1 journals/mam/KuknerWRKCPLG13 %A Kükner, Halil %A Weckx, Pieter %A Raghavan, Praveen %A Kaczer, Ben %A Catthoor, Francky %A der Perre, Liesbet Van %A Lauwereins, Rudy %A Groeseneken, Guido %D 2013 %J Microprocessors and Microsystems - Embedded Hardware Design %K dblp %N 8-A %P 792-800 %T Impact of duty factor, stress stimuli, gate and drive strength on gate delay degradation with an atomistic trap-based BTI model. %U http://dblp.uni-trier.de/db/journals/mam/mam37.html#KuknerWRKCPLG13 %V 37

@article{journals/mam/KuknerWRKCPLG13, added-at = {2013-11-19T00:00:00.000+0100}, author = {Kükner, Halil and Weckx, Pieter and Raghavan, Praveen and Kaczer, Ben and Catthoor, Francky and der Perre, Liesbet Van and Lauwereins, Rudy and Groeseneken, Guido}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2d43c25fb9470d308cc3736cc5dc5b1b2/dblp}, ee = {http://dx.doi.org/10.1016/j.micpro.2013.04.009}, interhash = {cbc71ae854ee31e7bbaf48b9cb8f050c}, intrahash = {d43c25fb9470d308cc3736cc5dc5b1b2}, journal = {Microprocessors and Microsystems - Embedded Hardware Design}, keywords = {dblp}, number = {8-A}, pages = {792-800}, timestamp = {2016-02-02T09:48:55.000+0100}, title = {Impact of duty factor, stress stimuli, gate and drive strength on gate delay degradation with an atomistic trap-based BTI model.}, url = {http://dblp.uni-trier.de/db/journals/mam/mam37.html#KuknerWRKCPLG13}, volume = 37, year = 2013 }