Author of the publication

Integral impact of BTI and voltage temperature variation on SRAM sense amplifier.

, , , , , , and . VTS, page 1-6. IEEE Computer Society, (2015)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

No persons found for author name Agbo, Innocent
add a person with the name Agbo, Innocent
 

Other publications of authors with the same name

BTI impact on SRAM sense amplifier., , and . IDT, page 1-6. IEEE, (2013)Integral impact of BTI and voltage temperature variation on SRAM sense amplifier., , , , , , and . VTS, page 1-6. IEEE Computer Society, (2015)Comparative analysis of RD and Atomistic trap-based BTI models on SRAM Sense Amplifier., , , , , , and . DTIS, page 1-6. IEEE, (2015)Comparative BTI analysis for various sense amplifier designs., , , , , , and . DDECS, page 68-73. IEEE, (2016)Quantification of Sense Amplifier Offset Voltage Degradation due to Zero-and Run-Time Variability., , , , , , , and . ISVLSI, page 725-730. IEEE Computer Society, (2016)Impact and mitigation of SRAM read path aging., , , , , , , and . Microelectronics Reliability, (2018)Parametric and Functional Degradation Analysis of Complete 14-nm FinFET SRAM., , , , , , and . IEEE Trans. VLSI Syst., 27 (6): 1308-1321 (2019)Degradation analysis of high performance 14nm FinFET SRAM., , , , , , and . DATE, page 201-206. IEEE, (2018)Hardware-Based Aging Mitigation Scheme for Memory Address Decoder., , , , , , and . ETS, page 1-6. IEEE, (2019)Bias Temperature Instability analysis of FinFET based SRAM cells., , , , , , and . DATE, page 1-6. European Design and Automation Association, (2014)