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Bias Temperature Instability analysis of FinFET based SRAM cells.

, , , , , , and . DATE, page 1-6. European Design and Automation Association, (2014)

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NBTI Monitoring and Design for Reliability in Nanoscale Circuits., , , and . DFT, page 68-76. IEEE Computer Society, (2011)BTI impact on SRAM sense amplifier., , and . IDT, page 1-6. IEEE, (2013)Modeling and mitigating NBTI in nanoscale circuits., and . IOLTS, page 1-6. IEEE Computer Society, (2011)BTI impact on logical gates in nano-scale CMOS technology., , , , and . DDECS, page 348-353. IEEE, (2012)Temperature dependence of NBTI induced delay., and . IOLTS, page 15-20. IEEE Computer Society, (2010)Bias temperature instability analysis in SRAM decoder., , , , and . ETS, page 1. IEEE Computer Society, (2013)Bias Temperature Instability analysis of FinFET based SRAM cells., , , , , , and . DATE, page 1-6. European Design and Automation Association, (2014)Impact of partial resistive defects and Bias Temperature Instability on SRAM decoder reliablity., , , , , and . IDT, page 1-6. IEEE, (2013)ReverseAge: An online NBTI combating technique using time borrowing., and . IDT, page 36-41. IEEE, (2011)Incorporating parameter variations in BTI impact on nano-scale logical gates analysis., , , , and . DFT, page 158-163. IEEE Computer Society, (2012)