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Disambiguation of "Martín-Martínez, Javier"

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CASE: A reliability simulation tool for analog ICs.

, , , , , , , and . SMACD, page 1-4. IEEE, (2017)

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Dr. Venancio Martinez Garcia University of Stuttgart

Javier Aguilar Romero University of Stuttgart

Andres Javier Zeller University of Stuttgart

Martin Baumann

Martin Schwartz University of Stuttgart

 

Other publications of authors with the same name

Reversible dielectric breakdown in ultrathin Hf based high-k stacks under current-limited stresses., , , , and . Microelectronics Reliability, 49 (9-11): 1024-1028 (2009)A New Time Efficient Methodology for the Massive Characterization of RTN in CMOS Devices., , , , , , , , and . IRPS, page 1-5. IEEE, (2019)Analysis of Body Bias and RTN-Induced Frequency Shift of Low Voltage Ring Oscillators in FDSOI Technology., , , , , , , , , and 2 other author(s). PATMOS, page 82-87. IEEE, (2018)Reliability in Super- and Near-Threshold Computing: A Unified Model of RTN, BTI, and PV., , , , and . IEEE Trans. on Circuits and Systems, 65-I (1): 293-306 (2018)TiDeVa: A Toolbox for the Automated and Robust Analysis of Time-Dependent Variability at Transistor Level., , , , , , , and . SMACD, page 197-200. IEEE, (2019)Experimental Characterization of Time-Dependent Variability in Ring Oscillators., , , , , , and . SMACD, page 229-232. IEEE, (2019)Including a stochastic model of aging in a reliability simulation flow., , , , , , , and . SMACD, page 1-4. IEEE, (2017)New method for the automated massive characterization of Bias Temperature Instability in CMOS transistors., , , , , , , and . DATE, page 150-155. IEEE, (2019)Generation of Lifetime-Aware Pareto-Optimal Fronts Using a Stochastic Reliability Simulator., , , , , , , , , and . DATE, page 78-83. IEEE, (2019)Aging in CMOS RF Linear Power Amplifiers: Experimental Comparison and Modeling., , , , , , and . ISCAS, page 1-5. IEEE, (2019)