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Disambiguation of "Diaz-Fortuny, Javier"

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New method for the automated massive characterization of Bias Temperature Instability in CMOS transistors.

, , , , , , , and . DATE, page 150-155. IEEE, (2019)

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Angel Diaz Carral University of Stuttgart

Ange Catalina Diaz Barrera University of Stuttgart

Laura Torralba Diaz University of Stuttgart

Javier Aguilar Romero University of Stuttgart

Andres Javier Zeller University of Stuttgart

 

Other publications of authors with the same name

A New Time Efficient Methodology for the Massive Characterization of RTN in CMOS Devices., , , , , , , , and . IRPS, page 1-5. IEEE, (2019)Automated Massive RTN Characterization Using a Transistor Array Chip., , , , , , , , and . SMACD, page 29-32. IEEE, (2018)A Model Parameter Extraction Methodology Including Time-Dependent Variability for Circuit Reliability Simulation., , , , , , , , and . SMACD, page 53-56. IEEE, (2018)A transistor array chip for the statistical characterization of process variability, RTN and BTI/CHC aging., , , , , , , , , and . SMACD, page 1-4. IEEE, (2017)TARS: A toolbox for statistical reliability modeling of CMOS devices., , , , , , and . SMACD, page 1-4. IEEE, (2017)Design Considerations of an SRAM Array for the Statistical Validation of Time-Dependent Variability Models., , , , , , , , , and 2 other author(s). SMACD, page 73-76. IEEE, (2018)New method for the automated massive characterization of Bias Temperature Instability in CMOS transistors., , , , , , , and . DATE, page 150-155. IEEE, (2019)TiDeVa: A Toolbox for the Automated and Robust Analysis of Time-Dependent Variability at Transistor Level., , , , , , , and . SMACD, page 197-200. IEEE, (2019)A Versatile CMOS Transistor Array IC for the Statistical Characterization of Time-Zero Variability, RTN, BTI, and HCI., , , , , , , , , and . J. Solid-State Circuits, 54 (2): 476-488 (2019)Weighted time lag plot defect parameter extraction and GPU-based BTI modeling for BTI variability., , , , , , , , , and . IRPS, page 6-1. IEEE, (2018)