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Design Considerations of an SRAM Array for the Statistical Validation of Time-Dependent Variability Models., , , , , , , , , and 2 other author(s). SMACD, page 73-76. IEEE, (2018)A New Time Efficient Methodology for the Massive Characterization of RTN in CMOS Devices., , , , , , , , and . IRPS, page 1-5. IEEE, (2019)Automated Massive RTN Characterization Using a Transistor Array Chip., , , , , , , , and . SMACD, page 29-32. IEEE, (2018)A Model Parameter Extraction Methodology Including Time-Dependent Variability for Circuit Reliability Simulation., , , , , , , , and . SMACD, page 53-56. IEEE, (2018)New method for the automated massive characterization of Bias Temperature Instability in CMOS transistors., , , , , , , and . DATE, page 150-155. IEEE, (2019)Generation of Lifetime-Aware Pareto-Optimal Fronts Using a Stochastic Reliability Simulator., , , , , , , , , and . DATE, page 78-83. IEEE, (2019)TiDeVa: A Toolbox for the Automated and Robust Analysis of Time-Dependent Variability at Transistor Level., , , , , , , and . SMACD, page 197-200. IEEE, (2019)