%0 Conference Paper %1 conf/date/Saraza-Canflanca19 %A Saraza-Canflanca, P. %A Diaz-Fortuny, Javier %A Castro-López, R. %A Moreno, Elisenda Roca %A Martín-Martínez, Javier %A Rodríguez, Rosana %A Nafría, Montserrat %A Fernández, Francisco V. %B DATE %D 2019 %E Teich, Jürgen %E Fummi, Franco %I IEEE %K dblp %P 150-155 %T New method for the automated massive characterization of Bias Temperature Instability in CMOS transistors. %U http://dblp.uni-trier.de/db/conf/date/date2019.html#Saraza-Canflanca19 %@ 978-3-9819263-2-3

@inproceedings{conf/date/Saraza-Canflanca19, added-at = {2019-05-22T00:00:00.000+0200}, author = {Saraza-Canflanca, P. and Diaz-Fortuny, Javier and Castro-López, R. and Moreno, Elisenda Roca and Martín-Martínez, Javier and Rodríguez, Rosana and Nafría, Montserrat and Fernández, Francisco V.}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/284c14f783dc82ff8848ed1200fe5d18b/dblp}, booktitle = {DATE}, crossref = {conf/date/2019}, editor = {Teich, Jürgen and Fummi, Franco}, ee = {https://doi.org/10.23919/DATE.2019.8715029}, interhash = {1a36e9a171836f366c1b844a821c437f}, intrahash = {84c14f783dc82ff8848ed1200fe5d18b}, isbn = {978-3-9819263-2-3}, keywords = {dblp}, pages = {150-155}, publisher = {IEEE}, timestamp = {2019-09-27T13:35:37.000+0200}, title = {New method for the automated massive characterization of Bias Temperature Instability in CMOS transistors.}, url = {http://dblp.uni-trier.de/db/conf/date/date2019.html#Saraza-Canflanca19}, year = 2019 }