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Disambiguation of "Bosio, Alberto"

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Special Issue: “Approximation at the Edge”

, , , , and . ACM transactions on embedded computing systems, 22 (4): 72 (2023)
DOI: 10.1145/3605757

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Hector Alberto Fernandez Bobadilla University of Stuttgart

Alberto Ramón Gallardo Rico University of Stuttgart

 

Other publications of authors with the same name

Automatic March tests generation for static and dynamic faults in SRAMs., , , , and . European Test Symposium, page 122-127. IEEE Computer Society, (2005)SyRA: Early System Reliability Analysis for Cross-Layer Soft Errors Resilience in Memory Arrays of Microprocessor Systems., , , , , , , , , and 4 other author(s). IEEE Trans. Computers, 68 (5): 765-783 (2019)Test and Reliability in Approximate Computing., , , , and . J. Electronic Testing, 34 (4): 375-387 (2018)Performances VS Reliability: how to exploit Approximate Computing for Safety-Critical applications., , , and . IOLTS, page 291-294. IEEE, (2018)Predicting the Impact of Functional Approximation: from Component- to Application-Level., , , , and . IOLTS, page 61-64. IEEE, (2018)LIFTING: A Flexible Open-Source Fault Simulator., and . ATS, page 35-40. IEEE Computer Society, (2008)Impact of resistive-open defects on the heat current of TAS-MRAM architectures., , , , , , , , and . DATE, page 532-537. IEEE, (2012)A two-layer SPICE model of the ATMEL TSTACTM eFlash memory technology for defect injection and faulty behavior prediction., , , , , , , , and . European Test Symposium, page 81-86. IEEE Computer Society, (2010)Analysis of resistive-bridging defects in SRAM core-cells: A comparative study from 90nm down to 40nm technology nodes., , , , , , and . European Test Symposium, page 132-137. IEEE Computer Society, (2010)Defect analysis in power mode control logic of low-power SRAMs., , , , , , and . European Test Symposium, page 1. IEEE Computer Society, (2012)