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Disambiguation of "Jenkins, Keith A."

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An On-Chip Test Structure and Digital Measurement Method for Statistical Characterization of Local Random Variability in a Process.

, , , , and . J. Solid-State Circuits, 43 (9): 1951-1963 (2008)

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A. Laukemann

Allison Keith University of Stuttgart

Christopher Jenkins University of Stuttgart

A. Laukemann

A. Laukemann

 

Other publications of authors with the same name

On-chip circuit to monitor long-term NBTI and PBTI degradation., and . Microelectronics Reliability, 53 (9-11): 1252-1256 (2013)Application of an SOI 0.12-µm CMOS technology to SoCs with low-power and high-frequency circuits., , , , , , , , , and 11 other author(s). IBM Journal of Research and Development, 47 (5-6): 611-630 (2003)A simple array-based test structure for the AC variability characterization of MOSFETs., , and . ISQED, page 539-544. IEEE, (2011)Detecting and Preventing Measurement Errors.. IEEE Design & Test of Computers, 14 (4): 78-86 (1997)Statistical Characterization and On-Chip Measurement Methods for Local Random Variability of a Process Using Sense-Amplifier-Based Test Structure., , , , and . ISSCC, page 400-611. IEEE, (2007)A statistical critical path monitor in 14nm CMOS., , , and . ICCD, page 507-511. IEEE Computer Society, (2016)On-Chip Circuit for Measuring Period Jitter and Skew of Clock Distribution Networks., , and . CICC, page 157-160. IEEE, (2007)Device design issues for a high-performance technology with Si or SiGe epitaxial base, , , , , , , and . Microelectronic Engineering, 15 (1-4): 11-14 (October 1991)Integrated RF And Microwave Components in BiCMOS Technology, , and . IEEE Transactions on Electron Devices, 43 (9): 1559-1570 (September 1996)High-performance emitter-up/down SiGe HBT's, , , , and . IEEE Electron Device Letters, 15 (9): 360-362 (September 1994)