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%0 Journal Article
%1 journals/jssc/MukhopadhyayKJC08
%A Mukhopadhyay, Saibal
%A Kim, Keunwoo
%A Jenkins, Keith A.
%A Chuang, Ching-Te
%A Roy, Kaushik
%D 2008
%J J. Solid-State Circuits
%K dblp
%N 9
%P 1951-1963
%T An On-Chip Test Structure and Digital Measurement Method for Statistical Characterization of Local Random Variability in a Process.
%U http://dblp.uni-trier.de/db/journals/jssc/jssc43.html#MukhopadhyayKJC08
%V 43
@article{journals/jssc/MukhopadhyayKJC08,
added-at = {2019-07-11T00:00:00.000+0200},
author = {Mukhopadhyay, Saibal and Kim, Keunwoo and Jenkins, Keith A. and Chuang, Ching-Te and Roy, Kaushik},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2fdcf0c9d57213521f36ac22677bc3a38/dblp},
ee = {https://doi.org/10.1109/JSSC.2008.2001896},
interhash = {7958f3414f1338662cfe15891ad86099},
intrahash = {fdcf0c9d57213521f36ac22677bc3a38},
journal = {J. Solid-State Circuits},
keywords = {dblp},
number = 9,
pages = {1951-1963},
timestamp = {2019-09-27T06:09:25.000+0200},
title = {An On-Chip Test Structure and Digital Measurement Method for Statistical Characterization of Local Random Variability in a Process.},
url = {http://dblp.uni-trier.de/db/journals/jssc/jssc43.html#MukhopadhyayKJC08},
volume = 43,
year = 2008
}