%0 Journal Article %1 journals/jssc/MukhopadhyayKJC08 %A Mukhopadhyay, Saibal %A Kim, Keunwoo %A Jenkins, Keith A. %A Chuang, Ching-Te %A Roy, Kaushik %D 2008 %J J. Solid-State Circuits %K dblp %N 9 %P 1951-1963 %T An On-Chip Test Structure and Digital Measurement Method for Statistical Characterization of Local Random Variability in a Process. %U http://dblp.uni-trier.de/db/journals/jssc/jssc43.html#MukhopadhyayKJC08 %V 43

@article{journals/jssc/MukhopadhyayKJC08, added-at = {2019-07-11T00:00:00.000+0200}, author = {Mukhopadhyay, Saibal and Kim, Keunwoo and Jenkins, Keith A. and Chuang, Ching-Te and Roy, Kaushik}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2fdcf0c9d57213521f36ac22677bc3a38/dblp}, ee = {https://doi.org/10.1109/JSSC.2008.2001896}, interhash = {7958f3414f1338662cfe15891ad86099}, intrahash = {fdcf0c9d57213521f36ac22677bc3a38}, journal = {J. Solid-State Circuits}, keywords = {dblp}, number = 9, pages = {1951-1963}, timestamp = {2019-09-27T06:09:25.000+0200}, title = {An On-Chip Test Structure and Digital Measurement Method for Statistical Characterization of Local Random Variability in a Process.}, url = {http://dblp.uni-trier.de/db/journals/jssc/jssc43.html#MukhopadhyayKJC08}, volume = 43, year = 2008 }