%0 Journal Article %1 journals/mr/MukherjeeJCZBAM17 %A Mukherjee, C. %A Jacquet, Thomas %A Chakravorty, Anjan %A Zimmer, Thomas %A Bock, Josef %A Aufinger, Klaus %A Maneux, Cristell %D 2017 %J Microelectronics Reliability %K dblp %P 146-152 %T Random telegraph noise in SiGe HBTs: Reliability analysis close to SOA limit. %U http://dblp.uni-trier.de/db/journals/mr/mr73.html#MukherjeeJCZBAM17 %V 73

@article{journals/mr/MukherjeeJCZBAM17, added-at = {2019-03-12T00:00:00.000+0100}, author = {Mukherjee, C. and Jacquet, Thomas and Chakravorty, Anjan and Zimmer, Thomas and Bock, Josef and Aufinger, Klaus and Maneux, Cristell}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/218bd726dde8a3c4ebd294b0ebe4c8da8/dblp}, ee = {https://doi.org/10.1016/j.microrel.2017.05.001}, interhash = {9cccf7d656a64e38cde047e2aa902a69}, intrahash = {18bd726dde8a3c4ebd294b0ebe4c8da8}, journal = {Microelectronics Reliability}, keywords = {dblp}, pages = {146-152}, timestamp = {2019-09-27T10:58:36.000+0200}, title = {Random telegraph noise in SiGe HBTs: Reliability analysis close to SOA limit.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr73.html#MukherjeeJCZBAM17}, volume = 73, year = 2017 }