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A World-Wide-Web based instrumentation pool real testing in a virtual world., , and . MSE, page 114-115. IEEE Computer Society, (1997)High Level Power and Energy Exploration Using ArchC., , , , , and . SBAC-PAD, page 25-32. IEEE Computer Society, (2010)A Distance Measurement Platform Dedicated to Electrical Engineering., , , , and . TLT, 2 (4): 312-319 (2009)Integration of remote lab exercises into standard course packages., , and . Int. J. Online Eng., (2007)On-wafer low frequency noise measurements of SiGe HBTs: Impact of technological improvements on 1/f noise., , , , and . Microelectronics Reliability, 44 (9-11): 1387-1392 (2004)Preliminary results of storage accelerated aging test on InP/InGaAs DHBT., , , , , , , , and . Microelectronics Reliability, 50 (9-11): 1548-1553 (2010)Reliability of submicron InGaAs/InP DHBT under thermal and electrical stresses., , , , , , , , , and . Microelectronics Reliability, 51 (9-11): 1730-1735 (2011)Reliability of high-speed SiGe: C HBT under electrical stress close to the SOA limit., , , , , , , and . Microelectronics Reliability, 55 (9-10): 1433-1437 (2015)Graphene FET evaluation for RF and mmWave circuit applications., , , , and . ISCAS, page 2920-2923. IEEE, (2015)A new physics-based compact model for Bilayer Graphene Field-Effect Transistors., , , , and . ESSDERC, page 180-183. IEEE, (2015)