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Reliability of submicron InGaAs/InP DHBT under thermal and electrical stresses.

, , , , , , , , , and . Microelectronics Reliability, 51 (9-11): 1730-1735 (2011)

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Design, Modelling and Characterization of a 3-Vppd 90-GBaud Over-110-GHz-Bandwidth Linear Driver in 0.5-μm InP DHBTs for Optical Communications., , , , , , , , and . BCICTS, page 1-4. IEEE, (2021)Advancements on reliability-aware analog circuit design., , , , , , , , , and . ESSCIRC, page 46-52. IEEE, (2012)InP DHBT Characterization up to 500 GHz and Compact Model Validation Towards THz Circuit Design., , , , , , , , and . BCICTS, page 1-4. IEEE, (2021)High Speed Multi-Level Drivers for Spectrally Efficient Optical Transmission Systems., , , , , , , , , and 2 other author(s). Bell Labs Technical Journal, 18 (3): 67-94 (2013)InP DHBT circuits: From device physics to 40Gb/s and 100Gb/s transmission system experiments., , , , , , , , , and 7 other author(s). Bell Labs Technical Journal, 14 (3): 43-62 (2009)InP DHBT Integrated Circuits for Fiber-Optic High-Speed Applications., , , , , and . IEICE Transactions, 89-C (7): 883-890 (2006)Investigation of the degradation mechanisms of InP/InGaAs DHBT under bias stress conditions to achieve electrical aging model for circuit design., , , , , , , , , and . Microelectronics Reliability, 51 (9-11): 1736-1741 (2011)1/f noise analysis of InP/InGaAs DHBTs submitted to bias and thermal stresses., , , , , , , and . Microelectronics Reliability, 43 (9-11): 1725-1730 (2003)Reliability of submicron InGaAs/InP DHBT under thermal and electrical stresses., , , , , , , , , and . Microelectronics Reliability, 51 (9-11): 1730-1735 (2011)0.4-μm InP/InGaAs DHBT with a 380-GHz $f_T$, > 600-GHz $f_\max$ and BVCE0 > 4.5 V., , , , , , , and . BCICTS, page 1-4. IEEE, (2021)