%0 Journal Article %1 journals/mr/KoneGHMMLZNG10 %A Koné, G. A. %A Grandchamp, Brice %A Hainaut, C. %A Marc, François %A Maneux, Cristell %A Labat, Nathalie %A Zimmer, Thomas %A Nodjiadjim, Virginie %A Godin, Jean %D 2010 %J Microelectronics Reliability %K dblp %N 9-11 %P 1548-1553 %T Preliminary results of storage accelerated aging test on InP/InGaAs DHBT. %U http://dblp.uni-trier.de/db/journals/mr/mr50.html#KoneGHMMLZNG10 %V 50

@article{journals/mr/KoneGHMMLZNG10, added-at = {2018-11-30T00:00:00.000+0100}, author = {Koné, G. A. and Grandchamp, Brice and Hainaut, C. and Marc, François and Maneux, Cristell and Labat, Nathalie and Zimmer, Thomas and Nodjiadjim, Virginie and Godin, Jean}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/264fb3e7ee6d9d7b1c6accbd9db7193fa/dblp}, ee = {https://doi.org/10.1016/j.microrel.2010.07.141}, interhash = {5be1425d419e64f14d848b7cb740f3fb}, intrahash = {64fb3e7ee6d9d7b1c6accbd9db7193fa}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = {9-11}, pages = {1548-1553}, timestamp = {2019-09-27T10:58:15.000+0200}, title = {Preliminary results of storage accelerated aging test on InP/InGaAs DHBT.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr50.html#KoneGHMMLZNG10}, volume = 50, year = 2010 }