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%0 Journal Article
%1 journals/mr/MukherjeeJCZBAM17
%A Mukherjee, C.
%A Jacquet, Thomas
%A Chakravorty, Anjan
%A Zimmer, Thomas
%A Bock, Josef
%A Aufinger, Klaus
%A Maneux, Cristell
%D 2017
%J Microelectronics Reliability
%K dblp
%P 146-152
%T Random telegraph noise in SiGe HBTs: Reliability analysis close to SOA limit.
%U http://dblp.uni-trier.de/db/journals/mr/mr73.html#MukherjeeJCZBAM17
%V 73
@article{journals/mr/MukherjeeJCZBAM17,
added-at = {2019-03-12T00:00:00.000+0100},
author = {Mukherjee, C. and Jacquet, Thomas and Chakravorty, Anjan and Zimmer, Thomas and Bock, Josef and Aufinger, Klaus and Maneux, Cristell},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/218bd726dde8a3c4ebd294b0ebe4c8da8/dblp},
ee = {https://doi.org/10.1016/j.microrel.2017.05.001},
interhash = {9cccf7d656a64e38cde047e2aa902a69},
intrahash = {18bd726dde8a3c4ebd294b0ebe4c8da8},
journal = {Microelectronics Reliability},
keywords = {dblp},
pages = {146-152},
timestamp = {2019-09-27T10:58:36.000+0200},
title = {Random telegraph noise in SiGe HBTs: Reliability analysis close to SOA limit.},
url = {http://dblp.uni-trier.de/db/journals/mr/mr73.html#MukherjeeJCZBAM17},
volume = 73,
year = 2017
}