Today, we publish two papers on Open Access (OA), a first one on successful OA implementation and a second one on OA for conference proceedings in engineering disciplines. On top of that, our association endorses the Action Plan for Diamond Open Access.
TextRelease is an initiative headed by Dr. Dominic J. Farace recognized for his accomplishments in the field of grey literature. Grey Literature is produced and distributed on all levels of government, academics, business and industry in print and electronic formats not controlled by commercial publishers i.e. where publishing is not the primary activity of the publishing body.
A. Birk, K. Frenner, and W. Osten. Fifteenth International Conference on Machine Vision (ICMV 2022), 12701, page 1270109. International Society for Optics and Photonics, SPIE, (2023)
D. Buchta, N. Hein, G. Pedrini, C. Krekel, and W. Osten. Optics for Arts, Architecture, and Archaeology V, 9527, page 95270Q. International Society for Optics and Photonics, SPIE, (2015)
A. Burla, T. Haist, W. Lyda, and .... Proc. SPIE, (2010)13 cites: https://scholar.google.com/scholar?cites=11729316344759848032&as_sdt=2005&sciodt=0,5&hl=en.
A. Burla, T. Haist, W. Lyda, M. Aissa, and .... … Systems for Industrial …, (2011)14 cites: https://scholar.google.com/scholar?cites=8158545852653943976&as_sdt=2005&sciodt=0,5&hl=en.
A. Burla, T. Haist, W. Lyda, A. Michael, and .... Proc. SPIE, (2010)1 cites: https://scholar.google.com/scholar?cites=12869458722280783790&as_sdt=2005&sciodt=0,5&hl=en.
B. Chen, S. Thiele, M. Xu, and A. Herkommer. Optical Design and Engineering VII, 10690, page 1069016. International Society for Optics and Photonics, SPIE, (2018)
S. Dong, T. Haist, T. Dietrich, and W. Osten. Unconventional Imaging and Wavefront Sensing 2014, 9227, page 922702. International Society for Optics and Photonics, SPIE, (2014)
J. Drozella, A. Toulouse, S. Thiele, and A. Herkommer. Novel Optical Systems, Methods, and Applications XXII, 11105, page 1110506. International Society for Optics and Photonics, SPIE, (2019)
A. Faridian, G. Pedrini, and W. Osten. Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXI, 8949, page 89490H. International Society for Optics and Photonics, SPIE, (2014)
D. Fleischle, W. Lyda, T. Haist, and W. Osten. DGaO Proceedings, (2009)4 cites: https://scholar.google.com/scholar?cites=16419362578584721445&as_sdt=2005&sciodt=0,5&hl=en.
R. Hahn, J. Görres, T. Haist, W. Osten, and S. Reichelt. Optical Sensing and Detection VII, 12139, page 121390I. International Society for Optics and Photonics, SPIE, (2022)
T. Haist, M. Gronle, T. Arnold, D. Bui, and .... Forum …, (2014)1 cites: https://scholar.google.com/scholar?cites=10236970921957896968&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, J. Hafner, M. Warber, and .... Proc. SPIE, (2008)16 cites: https://scholar.google.com/scholar?cites=3067665973075008776&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, C. Lingel, W. Osten, K. Bendel, and .... Proc. SPIE, (2013)2 cites: https://scholar.google.com/scholar?cites=3366503478753654556&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, C. Lingel, W. Osten, M. Winter, and .... Proc. SPIE, (2012)3 cites: https://scholar.google.com/scholar?cites=3562043095514685385&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, C. Lingel, W. Osten, M. Winter, and .... AIP Conference …, (2012)5 cites: https://scholar.google.com/scholar?cites=2722836634404284020&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, and W. Osten. International Workshop on Optical Supercomputing, (2008)10 cites: https://scholar.google.com/scholar?cites=17386422767713101032&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, and W. Osten. International Workshop on Optical Supercomputing, (2009)5 cites: https://scholar.google.com/scholar?cites=15570446517660484183&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, F. Lodholz, A. Faulhaber, and S. Reichelt. Automated Visual Inspection and Machine Vision V, 12623, page 126230E. International Society for Optics and Photonics, SPIE, (2023)
T. Haist, A. Steinitz, and F. Guerra. Optics and Photonics for Advanced Dimensional Metrology, 11352, page 1135204. International Society for Optics and Photonics, SPIE, (2020)
A. Harsch, C. Pruss, G. Baer, and W. Osten. Sixth European Seminar on Precision Optics Manufacturing, 11171, page 111710C. International Society for Optics and Photonics, SPIE, (2019)
A. Harsch, C. Pruss, A. Haberl, and W. Osten. Fifth European Seminar on Precision Optics Manufacturing, 10829, page 1082908. International Society for Optics and Photonics, SPIE, (2018)
S. Hartlieb, M. Boguslawski, T. Haist, and S. Reichelt. Optics and Photonics for Advanced Dimensional Metrology II, 12137, page 1213702. International Society for Optics and Photonics, SPIE, (2022)
M. Hasler, T. Haist, and W. Osten. Optical Micro-and Nanometrology …, (2012)5 cites: https://scholar.google.com/scholar?cites=8284401030473063862&as_sdt=2005&sciodt=0,5&hl=en.
A. Hermerschmidt, J. Haffner, T. Haist, and .... 2008 IEEE/LEOS …, (2008)1 cites: https://scholar.google.com/scholar?cites=2848751708087726317&as_sdt=2005&sciodt=0,5&hl=en.
H. Li, L. Fu, K. Frenner, and W. Osten. Modeling Aspects in Optical Metrology VI, 10330, page 103300Y. International Society for Optics and Photonics, SPIE, (2017)
C. Lingel, T. Haist, and W. Osten. Laser Beam Shaping XIII, (2012)3 cites: https://scholar.google.com/scholar?cites=8567045848525058300&as_sdt=2005&sciodt=0,5&hl=en.
C. Lingel, C. Thiel, T. Haist, and .... Proceedings of DGAO …, (2012)1 cites: https://scholar.google.com/scholar?cites=13207528513092743412&as_sdt=2005&sciodt=0,5&hl=en.
S. Ludwig, G. Pedrini, X. Peng, and W. Osten. Optical Measurement Systems for Industrial Inspection XII, 11782, page 1178214. International Society for Optics and Photonics, SPIE, (2021)
S. Ludwig, A. Singh, G. Pedrini, and W. Osten. Unconventional Optical Imaging, 10677, page 1067717. International Society for Optics and Photonics, SPIE, (2018)
W. Lyda, A. Burla, T. Haist, J. Zimmermann, and .... Optical Micro-and …, (2010)14 cites: https://scholar.google.com/scholar?cites=1524075053293164982&as_sdt=2005&sciodt=0,5&hl=en.
W. Lyda, D. Fleischle, T. Haist, and .... Optical Inspection and …, (2009)11 cites: https://scholar.google.com/scholar?cites=16198342556063896427&as_sdt=2005&sciodt=0,5&hl=en.
W. Osten, T. Haist, and E. Manske. Ultra-High-Definition Imaging …, (2018)4 cites: https://scholar.google.com/scholar?cites=15533727869778562690&as_sdt=2005&sciodt=0,5&hl=en.
W. Osten, G. Pedrini, P. Weidmann, and R. Gadow. SPECKLE 2015: VI International Conference on Speckle Metrology, 9660, page 96600H. International Society for Optics and Photonics, SPIE, (2015)