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Disambiguation of "Groeseneken, Guido"

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Low-frequency noise assessment of the transport mechanisms in SiGe channel bulk FinFETs.

, , , , , , , , , , and . ESSDERC, page 330-333. IEEE, (2012)

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Dr. phil. Guido Isekenmeier University of Stuttgart

Univ. -Prof. Dr. Guido Schneider University of Stuttgart

Univ. -Prof. Dr. Guido Schmitz University of Stuttgart

Dr. Guido Reina University of Stuttgart

 

Other publications of authors with the same name

Transient voltage overshoot in TLP testing - Real or artifact?, , , , , and . Microelectronics Reliability, 47 (7): 1016-1024 (2007)Physical origin of current collapse in Au-free AlGaN/GaN Schottky Barrier Diodes., , , , , , , , and . Microelectronics Reliability, 54 (9-10): 2196-2199 (2014)Gate oxide breakdown in FET devices and circuits: From nanoscale physics to system-level reliability., , , and . Microelectronics Reliability, 47 (4-5): 559-566 (2007)NBTI in Si0.55Ge0.45 cladding p-FinFETs: Porting the superior reliability from planar to 3D architectures., , , , , , , , , and . IRPS, page 2. IEEE, (2015)ESD protection diodes in optical interposer technology., , , , , , and . ICICDT, page 1-4. IEEE, (2015)Degradation analysis of datapath logic subblocks under NBTI aging in FinFET technology., , , , , , , , , and . ISQED, page 473-479. IEEE, (2014)Impact of slow and fast oxide traps on In0.53Ga0.47As device operation studied using CET maps., , , , , , and . IRPS, page 5. IEEE, (2018)Characterization of time-dependent variability using 32k transistor arrays in an advanced HK/MG technology., , , , , , , , , and . IRPS, page 3. IEEE, (2015)Impact of time-dependent variability on the yield and performance of 6T SRAM cells in an advanced HK/MG technology., , , , and . ICICDT, page 1-4. IEEE, (2015)Superior reliability and reduced Time-Dependent variability in high-mobility SiGe channel pMOSFETs for VLSI logic applications., , , , , , , , , and 6 other author(s). ICICDT, page 1-4. IEEE, (2012)