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Efficient RT-Level Fault Diagnosis., and . J. Comput. Sci. Technol., 20 (2): 166-174 (2005)Revival of partial scan: Test cube analysis driven conversion of flip-flops., and . VTS, page 260-265. IEEE Computer Society, (2011)Design and analysis of ring oscillator based Design-for-Trust technique., , , and . VTS, page 105-110. IEEE Computer Society, (2011)Adaptive reduction of the frequency search space for multi-vdd digital circuits., , , and . DATE, page 292-295. EDA Consortium San Jose, CA, USA / ACM DL, (2013)Is split manufacturing secure?, , and . DATE, page 1259-1264. EDA Consortium San Jose, CA, USA / ACM DL, (2013)Extending the Applicability of Parallel-Serial Scan Designs., , and . ICCD, page 200-203. IEEE Computer Society, (2004)Reconciling the IC test and security dichotomy., , , , , , and . ETS, page 1-6. IEEE Computer Society, (2013)Construction of an adaptive scan network for test time and data volume reduction.. IET Computers & Digital Techniques, 2 (1): 12-22 (2008)Multi-modal response compaction adaptive to x-density variation., and . IET Computers & Digital Techniques, 6 (2): 69-77 (2012)Novel hazard-free majority voter for n-modular redundancy-based fault tolerance in asynchronous circuits., and . IET Computers & Digital Techniques, 5 (4): 306-315 (2011)