PUMA

academical publication management
collect, organize, and share publications

( en | de )

 

Disambiguation of "Arslan, Baris"

Author of the publication

copydeleteadd this publication to your clipboard
Extending the Applicability of Parallel-Serial Scan Designs.

, , and . ICCD, page 200-203. IEEE Computer Society, (2004)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Baris Wenzel University of Stuttgart

Ayca Kula Arslan University of Stuttgart

Emre Baris Yildiz University of Stuttgart

 

Other publications of authors with the same name

Adaptive test optimization through real time learning of test effectiveness., and . DATE, page 1430-1435. IEEE, (2011)Aggressive Test Cost Reductions Through Continuous Test Effectiveness Assessment., and . IEEE Trans. on CAD of Integrated Circuits and Systems, 35 (12): 2093-2103 (2016)Delay test quality maximization through process-aware selection of test set size., and . ICCD, page 390-395. IEEE Computer Society, (2010)Tracing the best test mix through multi-variate quality tracking., and . VTS, page 1-6. IEEE Computer Society, (2013)Design space exploration for aggressive test cost reduction in CircularScan architectures., and . ICCAD, page 726-731. IEEE Computer Society / ACM, (2004)Full exploitation of process variation space for continuous delivery of optimal delay test quality., and . ASP-DAC, page 552-557. IEEE, (2013)Extracting Precise Diagnosis of Bridging Faults from Stuck-at Fault Information., and . Asian Test Symposium, page 230-235. IEEE Computer Society, (2003)Extending the Applicability of Parallel-Serial Scan Designs., , and . ICCD, page 200-203. IEEE Computer Society, (2004)Delay test resource allocation and scheduling for multiple frequency domains., and . VTS, page 114-119. IEEE Computer Society, (2012)Adaptive Test Framework for Achieving Target Test Quality at Minimal Cost., and . Asian Test Symposium, page 323-328. IEEE Computer Society, (2011)