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Disambiguation of "Arslan, Baris"

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Extending the Applicability of Parallel-Serial Scan Designs.

, , and . ICCD, page 200-203. IEEE Computer Society, (2004)

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Baris Wenzel University of Stuttgart

Ayca Kula Arslan University of Stuttgart

Emre Baris Yildiz University of Stuttgart

 

Other publications of authors with the same name

Adaptive test optimization through real time learning of test effectiveness., and . DATE, page 1430-1435. IEEE, (2011)Aggressive Test Cost Reductions Through Continuous Test Effectiveness Assessment., and . IEEE Trans. on CAD of Integrated Circuits and Systems, 35 (12): 2093-2103 (2016)Delay test quality maximization through process-aware selection of test set size., and . ICCD, page 390-395. IEEE Computer Society, (2010)Tracing the best test mix through multi-variate quality tracking., and . VTS, page 1-6. IEEE Computer Society, (2013)Design space exploration for aggressive test cost reduction in CircularScan architectures., and . ICCAD, page 726-731. IEEE Computer Society / ACM, (2004)Full exploitation of process variation space for continuous delivery of optimal delay test quality., and . ASP-DAC, page 552-557. IEEE, (2013)Extracting Precise Diagnosis of Bridging Faults from Stuck-at Fault Information., and . Asian Test Symposium, page 230-235. IEEE Computer Society, (2003)Extending the Applicability of Parallel-Serial Scan Designs., , and . ICCD, page 200-203. IEEE Computer Society, (2004)Fault Dictionary Size Reduction through Test Response Superposition., and . ICCD, page 480-. IEEE Computer Society, (2002)Power-Aware Delay Test Quality Optimization for Multiple Frequency Domains., and . IEEE Trans. on CAD of Integrated Circuits and Systems, 35 (1): 141-154 (2016)