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Device Design Issues for a High-Performance Bipolar Technology with Si Or SiGe Epitaxial Base

, , , , , , , and . Proceedings of the 21st European Solid State Device Research Conference, - ESSDERC ’91, 16 - 19 September 1991, Montreux, Switzerland, page 11-14. Amsterdam, Elsevier, (1991)

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Device design issues for a high-performance technology with Si or SiGe epitaxial base, , , , , , , and . Microelectronic Engineering, 15 (1-4): 11-14 (October 1991)Device Design Issues for a High-Performance Bipolar Technology with Si Or SiGe Epitaxial Base, , , , , , , and . Proceedings of the 21st European Solid State Device Research Conference, - ESSDERC ’91, 16 - 19 September 1991, Montreux, Switzerland, page 11-14. Amsterdam, Elsevier, (1991)Utilizing MVS/ESA's Library Lookaside in Your Installation.. Int. CMG Conference, page 799-807. Computer Measurement Group, (1989)The Performance Impact of 2-to-1 Folding and Block Size: A Simulation Analysis.. Int. CMG Conference, page 22-41. Computer Measurement Group, (1986)Impact of lens aberrations on optical lithography.. IBM Journal of Research and Development, 41 (1&2): 57-68 (1997)