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Disambiguation of "Becker, Bernd"

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Analysis of Reachable Sensitisable Paths in Sequential Circuits with SAT and Craig Interpolation.

, , , , and . VLSI Design, page 382-387. IEEE Computer Society, (2012)

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To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Univ. -Prof. Dr. -Ing. Steffen Becker University of Stuttgart

Pruning Modes for Deployment Models: From Manual Modeling to Automated Removal of Elements and Their Implications, , and . (2024)

Franziska Becker University of Stuttgart

Bernd Bertsche

Dr. -Ing. Dina Becker University of Stuttgart

Dr. rer. nat. Bernd Schulz University of Stuttgart

 

Other publications of authors with the same name

Low-Cost Hardening of Image Processing Applications Against Soft Errors., , , , and . DFT, page 274-279. IEEE Computer Society, (2006)Efficient SAT-Based Circuit Initialization for Larger Designs., , , and . VLSI Design, page 62-67. IEEE Computer Society, (2014)Provably optimal test cube generation using quantified boolean formula solving., , , , and . ASP-DAC, page 533-539. IEEE, (2013)Technische Informatik - eine einführende Darstellung., and . Oldenbourg, (2008)DFG-Projekt RealTest - Test und Zuverlässigkeit nanoelektronischer Systeme (DFG-Project - Test and Reliability of Nano-Electronic Systems)., , , , and . it - Information Technology, 48 (5): 304- (2006)TSV and DFT cost aware circuit partitioning for 3D-SOCs., , , and . ISQED, page 21-26. IEEE, (2012)An Analysis Framework for Transient-Error Tolerance., , and . VTS, page 249-255. IEEE Computer Society, (2007)Polynomial Formal Verification of Multipliers., , , , and . VTS, page 150-157. IEEE Computer Society, (1997)The Pros and Cons of Very-Low-Voltage Testing: An Analysis based on Resistive Bridging Faults., , , , and . VTS, page 171-178. IEEE Computer Society, (2004)An Electrical Model for the Fault Simulation of Small Delay Faults Caused by Crosstalk Aggravated Resistive Short Defects., , , , , , and . VTS, page 21-26. IEEE Computer Society, (2009)