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Effiziente Erfüllbarkeitsalgorithmen für die Generierung von Testmustern (Efficient Satisfiability Solving Algorithms for Test Pattern Generation)., , , , and . it - Information Technology, 51 (2): 102-111 (2009)Cell-aware analysis for small-delay effects and production test results from different fault models., , , , , , , and . ITC, page 1-8. IEEE Computer Society, (2011)Restrict Encoding for Mixed-Mode BIST., , , , , and . VTS, page 179-184. IEEE Computer Society, (2009)A New, Flexible and Very Accurate Crosstalk Fault Model to Analyze the Effects of Coupling Noise between the Interconnects on Signal Integrity Losses in Deep Submicron Chips., , , , and . Asian Test Symposium, page 22-27. IEEE Computer Society, (2005)Implementing a Scheme for External Deterministic Self-Test., , , , and . VTS, page 101-106. IEEE Computer Society, (2005)Introduction to the defect-oriented cell-aware test methodology for significant reduction of DPPM rates., and . European Test Symposium, page 1-6. IEEE Computer Society, (2012)Defect-oriented cell-internal testing., , , , , , , and . ITC, page 285-294. IEEE Computer Society, (2010)Deterministic logic BIST for transition fault testing., , , and . IET Computers & Digital Techniques, 1 (3): 180-186 (2007)Modeling and Analysis of Crosstalk Coupling Effect on the Victim Interconnect Using the ABCD Network Model., , , and . DFT, page 174-182. IEEE Computer Society, (2004)Computation and Application of Absolute Dominators in Industrial Designs., , and . European Test Symposium, page 137-144. IEEE Computer Society, (2007)