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Disambiguation of "Li, James Chien-Mo"

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Back-End-of-Line Defect Analysis for Rnv8T Nonvolatile SRAM.

, , , , , , , and . Asian Test Symposium, page 123-127. IEEE Computer Society, (2013)

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Univ. -Prof. Dr. James Foster University of Stuttgart

M.Sc. Yunxuan Li University of Stuttgart

Yu Li University of Stuttgart

Zheng Li University of Stuttgart

Jie Li University of Stuttgart

 

Other publications of authors with the same name

CSER: BISER-based concurrent soft-error resilience., , , , , and . VTS, page 153-158. IEEE Computer Society, (2010)Test Generation of Path Delay Faults Induced by Defects in Power TSV., , , , , and . Asian Test Symposium, page 43-48. IEEE Computer Society, (2013)On Optimizing Fault Coverage, Pattern Count, and ATPG Run Time Using a Hybrid Single-Capture Scheme for Testing Scan Designs., , , , , , , , , and . DFT, page 143-151. IEEE Computer Society, (2008)A new method for parameter estimation of high-order polynomial-phase signals., , , , and . Signal Processing, (2018)Launch-on-Shift Test Generation for Testing Scan Designs Containing Synchronous and Asynchronous Clock Domains., , , , , , , and . ACM Trans. Design Autom. Electr. Syst., 17 (4): 48:1-48:16 (2012)Survey of Scan Chain Diagnosis., , , and . IEEE Design & Test of Computers, 25 (3): 240-248 (2008)Fault Simulation and Test Pattern Generation for Cross-gate Defects in FinFET Circuits., , , , and . ATS, page 181-186. IEEE Computer Society, (2015)Diagnosis of Multiple Hold-Time and Setup-Time Faults in Scan Chains.. IEEE Trans. Computers, 54 (11): 1467-1472 (2005)Design and Chip Implementation of the Segment Weighted Random BIST for Low Power Testing., and . J. Low Power Electronics, 3 (2): 206-216 (2007)Column parity and row selection (CPRS): a BIST diagnosis technique for multiple errors in multiple scan chains., and . ITC, page 9. IEEE Computer Society, (2005)