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Disambiguation of "Yu, Chong-Gun"

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Drain breakdown voltage: A comparison between junctionless and inversion mode p-channel MOSFETs.

, , , , and . Microelectronics Reliability, 52 (9-10): 1945-1948 (2012)

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Wei Yu University of Stuttgart

Yasemin Gündüz University of Stuttgart

Dr. Levent Günes University of Stuttgart

Maiken Günther University of Stuttgart

Yiwen Yuan University of Stuttgart

 

Other publications of authors with the same name

Effects of device layout on the drain breakdown voltages in MuGFETs., , and . Microelectronics Reliability, 51 (9-11): 1547-1550 (2011)Drain breakdown voltage: A comparison between junctionless and inversion mode p-channel MOSFETs., , , , and . Microelectronics Reliability, 52 (9-10): 1945-1948 (2012)A comparative study on device degradation under a positive gate stress and hot carrier stress in InGaZnO thin film transistors., , , and . Microelectronics Reliability, 53 (9-11): 1814-1817 (2013)Comparative study of NBTI as a function of Si film orientation and thickness in SOI pMOSFETs., , , , , and . Microelectronics Reliability, 47 (9-11): 1411-1415 (2007)Increased hot carrier effects in Gate-All-Around SOI nMOSFET's., , , , and . Microelectronics Reliability, 43 (9-11): 1427-1432 (2003)Hot carrier and PBTI induced degradation in silicon nanowire gate-all-around SONOS MOSFETs., , , and . Microelectronics Reliability, 54 (9-10): 2325-2328 (2014)Effect of source and drain asymmetry on hot carrier degradation in vertical nanowire MOSFETs., , , and . Microelectronics Reliability, 55 (9-10): 1456-1459 (2015)NBTI and hot carrier effect of SOI p-MOSFETs fabricated in strained Si SOI wafer., , , , , and . Microelectronics Reliability, 49 (9-11): 994-997 (2009)Nanowire width dependence of data retention and endurance characteristics in nanowire SONOS flash memory., , and . Microelectronics Reliability, (2016)New experimental findings on hot-carrier-induced degradation in lateral DMOS transistors., , , , and . Microelectronics Reliability, 46 (9-11): 1864-1867 (2006)