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Disambiguation of "Park, Jong-Tae"

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A comparative study on device degradation under a positive gate stress and hot carrier stress in InGaZnO thin film transistors.

, , , and . Microelectronics Reliability, 53 (9-11): 1814-1817 (2013)

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Sumee Park

Soo Yong Park University of Stuttgart

Jong Hyun Jung University of Stuttgart

 

Other publications of authors with the same name

Adaptive handover method with application-awareness for multimedia streaming service in wireless LAN., , , and . ICOIN, page 1-7. IEEE, (2009)Analysis of edge and corner bonded PSvfBGA reliability under thermal cycling conditions by experimental and finite element methods., , , , , and . Microelectronics Reliability, 52 (9-10): 1870-1875 (2012)Concurrent PBTI and hot carrier degradation in n-channel MuGFETs., , , and . Microelectronics Reliability, 51 (9-11): 1544-1546 (2011)Impact of back gate biases on hot carrier effects in multiple gate junctionless transistors., , and . Microelectronics Reliability, 53 (9-11): 1329-1332 (2013)Effects of hot carrier stress on the RF performance in SOI MOSFETs., , and . Microelectronics Reliability, 44 (9-11): 1637-1642 (2004)Hot electron induced punchthrough voltage of p-channel SOI MOSFET's at room and elevated temperatures., , , and . Microelectronics Reliability, 43 (9-11): 1477-1482 (2003)Policy-based distributed management architecture for large-scale enterprise conferencing service using SIP., , , , and . IEEE Journal on Selected Areas in Communications, 23 (10): 1934-1949 (2005)Intelligent mobile IPv6 handover with multiple pre-registrations and late tunneling., , and . COMSWARE, page 551-554. IEEE, (2008)CORBA-based integrated control and management for IMT-2000 global roaming service., , , and . NOMS, page 891-904. IEEE, (2000)Design and implementation of a CORBA-based TMN SMK system., , , and . NOMS, page 64-74. IEEE, (1996)