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%0 Journal Article
%1 journals/mr/LeeLLP11
%A Lee, Seung Min
%A Lee, Dong Hun
%A Lee, Jae Ki
%A Park, Jong-Tae
%D 2011
%J Microelectronics Reliability
%K dblp
%N 9-11
%P 1544-1546
%T Concurrent PBTI and hot carrier degradation in n-channel MuGFETs.
%U http://dblp.uni-trier.de/db/journals/mr/mr51.html#LeeLLP11
%V 51
@article{journals/mr/LeeLLP11,
added-at = {2012-10-18T00:00:00.000+0200},
author = {Lee, Seung Min and Lee, Dong Hun and Lee, Jae Ki and Park, Jong-Tae},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2b0529e117cf4e15dbab58344b5c3dd30/dblp},
ee = {http://dx.doi.org/10.1016/j.microrel.2011.06.006},
interhash = {7bbea810d4d36545f495414bea98ff7d},
intrahash = {b0529e117cf4e15dbab58344b5c3dd30},
journal = {Microelectronics Reliability},
keywords = {dblp},
number = {9-11},
pages = {1544-1546},
timestamp = {2016-02-02T02:00:06.000+0100},
title = {Concurrent PBTI and hot carrier degradation in n-channel MuGFETs.},
url = {http://dblp.uni-trier.de/db/journals/mr/mr51.html#LeeLLP11},
volume = 51,
year = 2011
}
