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Resilience Articulation Point (RAP): Cross-layer dependability modeling for nanometer system-on-chip resilience., , , , , , , , , and 10 other author(s). Microelectronics Reliability, 54 (6-7): 1066-1074 (2014)The Impact of Random Device Variation on SRAM Cell Stability in Sub-90-nm CMOS Technologies., and . IEEE Trans. VLSI Syst., 16 (1): 86-97 (2008)Keynote 1 - VLSI 2.0: R&D Post Moore., , and . VLSI-SoC, IEEE, (2013)Process variability at the 65nm node and beyond.. CICC, page 1-8. IEEE, (2008)Optimal shielding/spacing metrics for low power design., , and . ISVLSI, page 167-172. IEEE Computer Society, (2003)Incorporating the impacts of workload-dependent runtime variations into timing analysis., , , and . DATE, page 1022-1025. EDA Consortium San Jose, CA, USA / ACM DL, (2013)Efficient and product-representative timing model validation., , , and . VTS, page 90-95. IEEE Computer Society, (2011)Statistical yield analysis of silicon-on-insulator embedded DRAM., , , , , , , and . ISQED, page 190-194. IEEE Computer Society, (2009)Assessment of True Worst Case Circuit Performance Under Interconnect Parameter Variations., , , and . ISQED, page 431-436. IEEE Computer Society, (2001)Coupling timing objectives with optical proximity correction for improved timing yield., , , , , and . ISQED, page 97-102. IEEE, (2011)