%0 Journal Article %1 journals/mr/HerkersdorfAEGGHKKKMNRRSSTTWWW14 %A Herkersdorf, Andreas %A Aliee, Hananeh %A Engel, Michael %A Glaß, Michael %A Gimmler-Dumont, Christina %A Henkel, Jörg %A Kleeberger, Veit %A Kochte, Michael A. %A Kühn, Johannes Maximilian %A Mueller-Gritschneder, Daniel %A Nassif, Sani R. %A Rauchfuss, Holm %A Rosenstiel, Wolfgang %A Schlichtmann, Ulf %A Shafique, Muhammad %A Tahoori, Mehdi Baradaran %A Teich, Jürgen %A Wehn, Norbert %A Weis, Christian %A Wunderlich, Hans-Joachim %D 2014 %J Microelectronics Reliability %K dblp %N 6-7 %P 1066-1074 %T Resilience Articulation Point (RAP): Cross-layer dependability modeling for nanometer system-on-chip resilience. %U http://dblp.uni-trier.de/db/journals/mr/mr54.html#HerkersdorfAEGGHKKKMNRRSSTTWWW14 %V 54

@article{journals/mr/HerkersdorfAEGGHKKKMNRRSSTTWWW14, added-at = {2014-08-06T00:00:00.000+0200}, author = {Herkersdorf, Andreas and Aliee, Hananeh and Engel, Michael and Glaß, Michael and Gimmler-Dumont, Christina and Henkel, Jörg and Kleeberger, Veit and Kochte, Michael A. and Kühn, Johannes Maximilian and Mueller-Gritschneder, Daniel and Nassif, Sani R. and Rauchfuss, Holm and Rosenstiel, Wolfgang and Schlichtmann, Ulf and Shafique, Muhammad and Tahoori, Mehdi Baradaran and Teich, Jürgen and Wehn, Norbert and Weis, Christian and Wunderlich, Hans-Joachim}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/23e31dfdba4908ec38e0d2498752579f7/dblp}, ee = {http://dx.doi.org/10.1016/j.microrel.2013.12.012}, interhash = {8e409a1c06ded6ca1be58121a7a66cb0}, intrahash = {3e31dfdba4908ec38e0d2498752579f7}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = {6-7}, pages = {1066-1074}, timestamp = {2016-02-02T02:00:35.000+0100}, title = {Resilience Articulation Point (RAP): Cross-layer dependability modeling for nanometer system-on-chip resilience.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr54.html#HerkersdorfAEGGHKKKMNRRSSTTWWW14}, volume = 54, year = 2014 }