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Exploring the Limitations of Software-based Techniques in SEE Fault Coverage., , , and . J. Electronic Testing, 27 (4): 541-550 (2011)Single Event Upset in SRAM-based Field Programmable Analog Arrays: Effects and Mitigation., , , and . ISVLSI, page 192-197. IEEE Computer Society, (2007)A broad strategy to detect crosstalk faults in network-on-chip interconnects., , , , and . VLSI-SoC, page 298-303. IEEE, (2010)Improving Reliability in NoCs by Application-Specific Mapping Combined with Adaptive Fault-Tolerant Method in the Links., , , and . European Test Symposium, page 123-128. IEEE Computer Society, (2011)Design of a Robust 8-Bit Microprocessor to Soft Errors., , and . IOLTS, page 195-196. IEEE Computer Society, (2006)On the Optimal Design of Triple Modular Redundancy Logic for SRAM-based FPGAs, , , and . CoRR, (2007)Application-Based Analysis of Register File Criticality for Reliability Assessment in Embedded Microprocessors., , , , and . J. Electronic Testing, 31 (2): 139-150 (2015)Impact of different transistor arrangements on gate variability., , , , , and . Microelectronics Reliability, (2018)Using dynamic partial reconfiguration to detect sees in microprocessors through non-intrusive hybrid technique., , , , , and . SBCCI, page 161-166. ACM, (2011)Comparative Analysis of Inference Errors in a Neural Network Implemented in SRAM-Based FPGA Induced by Neutron Irradiation and Fault Injection Methods., , , , and . SBCCI, page 1-6. IEEE, (2018)