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Design of a Robust 8-Bit Microprocessor to Soft Errors.

, , and . IOLTS, page 195-196. IEEE Computer Society, (2006)

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Improving Reliability in NoCs by Application-Specific Mapping Combined with Adaptive Fault-Tolerant Method in the Links., , , and . European Test Symposium, page 123-128. IEEE Computer Society, (2011)Single Event Upset in SRAM-based Field Programmable Analog Arrays: Effects and Mitigation., , , and . ISVLSI, page 192-197. IEEE Computer Society, (2007)Design of a Robust 8-Bit Microprocessor to Soft Errors., , and . IOLTS, page 195-196. IEEE Computer Society, (2006)Using dynamic partial reconfiguration to detect sees in microprocessors through non-intrusive hybrid technique., , , , , and . SBCCI, page 161-166. ACM, (2011)Comparative Analysis of Inference Errors in a Neural Network Implemented in SRAM-Based FPGA Induced by Neutron Irradiation and Fault Injection Methods., , , , and . SBCCI, page 1-6. IEEE, (2018)Applying lockstep in dual-core ARM Cortex-A9 to mitigate radiation-induced soft errors., , and . LASCAS, page 1-4. IEEE, (2017)Applying TMR in Hardware Accelerators Generated by High-Level Synthesis Design Flow for Mitigating Multiple Bit Upsets in SRAM-Based FPGAs., , , , and . ARC, volume 10216 of Lecture Notes in Computer Science, page 202-213. (2017)Exploring the Limitations of Software-based Techniques in SEE Fault Coverage., , , and . J. Electronic Testing, 27 (4): 541-550 (2011)A broad strategy to detect crosstalk faults in network-on-chip interconnects., , , , and . VLSI-SoC, page 298-303. IEEE, (2010)Application-Based Analysis of Register File Criticality for Reliability Assessment in Embedded Microprocessors., , , , and . J. Electronic Testing, 31 (2): 139-150 (2015)