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Embedded synthetic instruments for Board-Level testing.

, , , and . European Test Symposium, page 1. IEEE Computer Society, (2012)

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On coverage of timing related faults at board level., , and . ETS, page 1-2. IEEE, (2016)Fault collapsing with linear complexity in digital circuits., , , and . ISCAS, page 653-656. IEEE, (2010)Asynchronous Fault Detection in IEEE P1687 Instrument Network., , and . NATW, page 73-78. IEEE, (2014)Structurally synthesized multiple input BDDs for simulation of digital circuits., , , and . ICECS, page 451-454. IEEE, (2009)Reseeding using compaction of pre-generated LFSR sub-sequences., , , and . ICECS, page 1290-1295. IEEE, (2008)Ultra Fast Parallel Fault Analysis on Structurally Synthesized BDDs., , , and . European Test Symposium, page 131-136. IEEE Computer Society, (2007)A new FPGA-based Detection Method for Spurious Variations in PCBA Power Distribution Network., , , , and . DDECS, page 1-6. IEEE, (2019)Structurally Synthesized Multiple Input BDDs for Speeding Up Logic-Level Simulation of Digital Circuits., , , , and . DSD, page 658-663. IEEE Computer Society, (2010)Timing simulation of digital circuits with binary decision diagrams., , and . DATE, page 460-466. IEEE Computer Society, (2001)Structural fault collapsing by superposition of BDDs for test generation in digital circuits., , , and . ISQED, page 250-257. IEEE, (2010)