PUMA

academical publication management
collect, organize, and share publications

( en | de )

 

Disambiguation of "Guo, Ruifeng"

Author of the publication

copydeleteadd this publication to your clipboard
Diagnosis and Layout Aware (DLA) Scan Chain Stitching.

, , , , , , , , , , , , , , and . IEEE Trans. VLSI Syst., 23 (3): 466-479 (2015)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Yanan Guo University of Stuttgart

 

Other publications of authors with the same name

Enabling yield analysis with X-compact., , , and . ITC, page 9. IEEE Computer Society, (2005)Speed-Path Debug Using At-Speed Scan Test Patterns., , and . European Test Symposium, page 11-16. IEEE Computer Society, (2009)Diagnosis of Multiple Physical Defects Using Logic Fault Models., , , and . Asian Test Symposium, page 94-99. IEEE Computer Society, (2010)A Robust Automated Scan Pattern Mismatch Debugger., , and . ATS, page 309-314. IEEE Computer Society, (2008)Enhancing Transition Fault Model for Delay Defect Diagnosis., , , , , , , , and . ATS, page 179-184. IEEE Computer Society, (2008)Evaluation of Test Metrics: Stuck-at, Bridge Coverage Estimate and Gate Exhaustive., , , , , and . VTS, page 66-71. IEEE Computer Society, (2006)Using Scan-Dump Values to Improve Functional-Diagnosis Methodology., , , , , and . VTS, page 231-238. IEEE Computer Society, (2007)Scan Chain Diagnosis by Adaptive Signal Profiling with Manufacturing ATPG Patterns., , , , , and . Asian Test Symposium, page 35-40. IEEE Computer Society, (2009)Static test compaction for synchronous sequential circuits based on vector restoration., , and . IEEE Trans. on CAD of Integrated Circuits and Systems, 18 (7): 1040-1049 (1999)Material Removal Simulation of Multi-axis NC Milling Based on Spatial Partitioning Level of Detail Model., , , , and . CIT, page 536-540. IEEE Computer Society, (2012)