%0 Journal Article %1 journals/tcad/PomeranzRG99 %A Pomeranz, Irith %A Reddy, Sudhakar M. %A Guo, Ruifeng %D 1999 %J IEEE Trans. on CAD of Integrated Circuits and Systems %K dblp %N 7 %P 1040-1049 %T Static test compaction for synchronous sequential circuits based on vector restoration. %U http://dblp.uni-trier.de/db/journals/tcad/tcad18.html#PomeranzRG99 %V 18

@article{journals/tcad/PomeranzRG99, added-at = {2016-03-18T00:00:00.000+0100}, author = {Pomeranz, Irith and Reddy, Sudhakar M. and Guo, Ruifeng}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/23c84d5ffc38ffc424f817b1dc94be9ef/dblp}, ee = {http://dx.doi.org/10.1109/43.771184}, interhash = {411f0343f5caac6eb1bcf2762993ea44}, intrahash = {3c84d5ffc38ffc424f817b1dc94be9ef}, journal = {IEEE Trans. on CAD of Integrated Circuits and Systems}, keywords = {dblp}, number = 7, pages = {1040-1049}, timestamp = {2016-03-19T10:33:12.000+0100}, title = {Static test compaction for synchronous sequential circuits based on vector restoration.}, url = {http://dblp.uni-trier.de/db/journals/tcad/tcad18.html#PomeranzRG99}, volume = 18, year = 1999 }