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Evaluation of Test Metrics: Stuck-at, Bridge Coverage Estimate and Gate Exhaustive.

, , , , , and . VTS, page 66-71. IEEE Computer Society, (2006)

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Implication and Evaluation Techniques for Proving Fault Equivalence., , , and . VTS, page 201-213. IEEE Computer Society, (1999)Theorems for Efficient Identification of Indistinguishable Fault Pairs in Synchronous Sequential Circuits., , and . VTS, page 181-186. IEEE Computer Society, (2002)Improving Precision Using Mixed-level Fault Diagnosis., , and . ITC, page 1-10. IEEE Computer Society, (2006)Fault Equivalence Identification Using Redundancy Information and Static and Dynamic Extraction., , , and . VTS, page 124-130. IEEE Computer Society, (2001)Dominance Based Analysis for Large Volume Production Fail Diagnosis., , , , and . VTS, page 392-399. IEEE Computer Society, (2006)Microprocessor system failures debug and fault isolation methodology., , and . ITC, page 1-10. IEEE Computer Society, (2009)Concurrent Execution of Diagnostic Fault Simulation and Equivalence Identification During Diagnostic Test Generation., , , , and . VTS, page 351-358. IEEE Computer Society, (2003)Defect diagnosis based on DFM guidelines., , , and . VTS, page 206-211. IEEE Computer Society, (2010)Evaluation of the Quality of N-Detect Scan ATPG Patterns on a Processor., , , and . ITC, page 669-678. IEEE Computer Society, (2004)Logic BIST silicon debug and volume diagnosis methodology., , , , and . ITC, page 1-10. IEEE Computer Society, (2011)