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On the volatility of oxide defects: Activation, deactivation, and transformation.

T. Grasser, M. Wahl, W. Gös, Y. Wimmer, A. El-Sayed, A. Shluger, and B. Kaczer. IRPS, page 5. IEEE, (2015)

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Hon. -Prof. Dr. -Ing. Walter Gösele University of Stuttgart

David Gösele University of Stuttgart

apl. Prof. Dr. Wolfgang Hauber University of Stuttgart

Enhanced Risky Choice in Male Rats Elicited by the Acute Pharmacological Stressor Yohimbine Involves Prefrontal Dopamine D1 Receptor ActivationA. Münster, J. Huster, S. Sommer, C. Traxler, A. Votteler, and W. Hauber. The international journal of neuropsychopharmacology, 27 (2): pyae006 (2024)

Dr. Wolfgang Frey University of Stuttgart

Chirality Transfer of Stereogenic Boron Centers Enabled by a SN2-Type MechanismY. Stöckl, K. Gugeler, C. Holzwarth, W. Frey, S. Wegner, B. Claasen, A. Zens, D. Gudat, C. Sindlinger, J. Kästner and 1 other author(s). Organometallics, 43 (3): 330-340 (2024)Comparison of the Catalytic Activity of Surface-Immobilized Copper Complexes with Phosphonate Anchoring Groups for Atom Transfer Radical Cyclizations and AdditionsS. Maier, T. Nagel, M. Turan, E. Kaya, W. Frey, M. Dyballa, and D. Estes. Organometallics, 43 (3): 233-241 (2024)

Raymond Gosliga University of Stuttgart

Other publications of authors with the same name

On the volatility of oxide defects: Activation, deactivation, and transformation.T. Grasser, M. Wahl, W. Gös, Y. Wimmer, A. El-Sayed, A. Shluger, and B. Kaczer. IRPS, page 5. IEEE, (2015)Characterization and modeling of charge trapping: From single defects to devices.T. Grasser, G. Rzepa, M. Waltl, W. Gös, K. Rott, G. Rott, H. Reisinger, J. Franco, and B. Kaczer. ICICDT, page 1-4. IEEE, (2014)Identification of oxide defects in semiconductor devices: A systematic approach linking DFT to rate equations and experimental evidence.W. Gös, Y. Wimmer, A. El-Sayed, G. Rzepa, M. Jech, A. Shluger, and T. Grasser. Microelectronics Reliability, (2018)Switching Speedup of the Magnetic Free Layer of Advanced SOT-MRAM.R. de Orio, A. Makarov, S. Selberherr, W. Gös, J. Ender, S. Fiorentini, and V. Sverdlov. ESSDERC, page 146-149. IEEE, (2019)Impact of O-Si-O bond angle fluctuations on the Si-O bond-breakage rate.S. Tyaginov, V. Sverdlov, I. Starkov, W. Gös, and T. Grasser. Microelectronics Reliability, 49 (9-11): 998-1002 (2009)Characterization and modeling of reliability issues in nanoscale devices.G. Rzepa, W. Gös, B. Kaczer, and T. Grasser. ISCAS, page 2445-2448. IEEE, (2015)VSP - A gate stack analyzer.M. Karner, A. Gehring, M. Wagner, R. Entner, S. Holzer, W. Gös, M. Vasicek, T. Grasser, H. Kosina, and S. Selberherr. Microelectronics Reliability, 47 (4-5): 704-708 (2007)The defect-centric perspective of device and circuit reliability - From individual defects to circuits.B. Kaczer, J. Franco, P. Weckx, P. Roussel, E. Bury, M. Cho, R. Degraeve, D. Linten, G. Groeseneken, H. Kukner and 5 other author(s). ESSDERC, page 218-225. IEEE, (2015)The effect of uniaxial stress on band structure and electron mobility of silicon.E. Ungersboeck, W. Gös, S. Dhar, H. Kosina, and S. Selberherr. Mathematics and Computers in Simulation, 79 (4): 1071-1077 (2008)

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Disambiguation of "Gös, Wolfgang"

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On the volatility of oxide defects: Activation, deactivation, and transformation.

Please choose a person to relate this publication to

Hon. -Prof. Dr. -Ing. Walter Gösele University of Stuttgart

David Gösele University of Stuttgart

apl. Prof. Dr. Wolfgang Hauber University of Stuttgart

Dr. Wolfgang Frey University of Stuttgart

Raymond Gosliga University of Stuttgart

Other publications of authors with the same name

Disambiguation

PUMA

Disambiguation of "Gös, Wolfgang"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML On the volatility of oxide defects: Activation, deactivation, and transformation.

Please choose a person to relate this publication to

Hon. -Prof. Dr. -Ing. Walter Gösele University of Stuttgart

David Gösele University of Stuttgart

apl. Prof. Dr. Wolfgang Hauber University of Stuttgart

Dr. Wolfgang Frey University of Stuttgart

Raymond Gosliga University of Stuttgart

Other publications of authors with the same name

Disambiguation

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history of this post
URL
DOI
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APA
Chicago
DIN 1505
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On the volatility of oxide defects: Activation, deactivation, and transformation.