%0 Journal Article %1 journals/mr/KarnerGWEHGVGKS07 %A Karner, Markus %A Gehring, Andreas %A Wagner, M. %A Entner, Robert %A Holzer, Stefan %A Gös, Wolfgang %A Vasicek, M. %A Grasser, Tibor %A Kosina, Hans %A Selberherr, Siegfried %D 2007 %J Microelectronics Reliability %K dblp %N 4-5 %P 704-708 %T VSP - A gate stack analyzer. %U http://dblp.uni-trier.de/db/journals/mr/mr47.html#KarnerGWEHGVGKS07 %V 47

@article{journals/mr/KarnerGWEHGVGKS07, added-at = {2019-06-02T00:00:00.000+0200}, author = {Karner, Markus and Gehring, Andreas and Wagner, M. and Entner, Robert and Holzer, Stefan and Gös, Wolfgang and Vasicek, M. and Grasser, Tibor and Kosina, Hans and Selberherr, Siegfried}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2dc5ec548f3ac5e7468a618869e79d685/dblp}, ee = {https://www.wikidata.org/entity/Q62600303}, interhash = {a1f31ba49b3d88d21541687046d98bdc}, intrahash = {dc5ec548f3ac5e7468a618869e79d685}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = {4-5}, pages = {704-708}, timestamp = {2019-09-27T10:58:15.000+0200}, title = {VSP - A gate stack analyzer.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr47.html#KarnerGWEHGVGKS07}, volume = 47, year = 2007 }