%0 Journal Article %1 journals/mr/GosWERJSG18 %A Gös, Wolfgang %A Wimmer, Yannick %A El-Sayed, A.-M. %A Rzepa, Gerhard %A Jech, Markus %A Shluger, Alexander L. %A Grasser, Tibor %D 2018 %J Microelectronics Reliability %K dblp %P 286-320 %T Identification of oxide defects in semiconductor devices: A systematic approach linking DFT to rate equations and experimental evidence. %U http://dblp.uni-trier.de/db/journals/mr/mr87.html#GosWERJSG18 %V 87

@article{journals/mr/GosWERJSG18, added-at = {2019-02-08T00:00:00.000+0100}, author = {Gös, Wolfgang and Wimmer, Yannick and El-Sayed, A.-M. and Rzepa, Gerhard and Jech, Markus and Shluger, Alexander L. and Grasser, Tibor}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/25f57ed55532ab20c69091a10538799bc/dblp}, ee = {https://doi.org/10.1016/j.microrel.2017.12.021}, interhash = {421f9e42efba4ec236a1b5341bf196cf}, intrahash = {5f57ed55532ab20c69091a10538799bc}, journal = {Microelectronics Reliability}, keywords = {dblp}, pages = {286-320}, timestamp = {2019-09-27T10:58:31.000+0200}, title = {Identification of oxide defects in semiconductor devices: A systematic approach linking DFT to rate equations and experimental evidence.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr87.html#GosWERJSG18}, volume = 87, year = 2018 }