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%0 Conference Paper
%1 conf/icicdt/GrasserRWGRRRFK14
%A Grasser, Tibor
%A Rzepa, Gerhard
%A Waltl, Michael
%A Gös, Wolfgang
%A Rott, Karina
%A Rott, Gunnar Andreas
%A Reisinger, Hans
%A Franco, Jacopo
%A Kaczer, Ben
%B ICICDT
%D 2014
%I IEEE
%K dblp
%P 1-4
%T Characterization and modeling of charge trapping: From single defects to devices.
%U http://dblp.uni-trier.de/db/conf/icicdt/icicdt2014.html#GrasserRWGRRRFK14
%@ 978-1-4799-2153-9
@inproceedings{conf/icicdt/GrasserRWGRRRFK14,
added-at = {2019-02-08T00:00:00.000+0100},
author = {Grasser, Tibor and Rzepa, Gerhard and Waltl, Michael and Gös, Wolfgang and Rott, Karina and Rott, Gunnar Andreas and Reisinger, Hans and Franco, Jacopo and Kaczer, Ben},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/22315dc9ab13bc599496e91bd0137f7e9/dblp},
booktitle = {ICICDT},
crossref = {conf/icicdt/2014},
ee = {https://doi.org/10.1109/ICICDT.2014.6838620},
interhash = {0dca5e7f6d98cdf1d40dcc24abb2eda1},
intrahash = {2315dc9ab13bc599496e91bd0137f7e9},
isbn = {978-1-4799-2153-9},
keywords = {dblp},
pages = {1-4},
publisher = {IEEE},
timestamp = {2019-09-27T21:39:33.000+0200},
title = {Characterization and modeling of charge trapping: From single defects to devices.},
url = {http://dblp.uni-trier.de/db/conf/icicdt/icicdt2014.html#GrasserRWGRRRFK14},
year = 2014
}