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A Digital and Wide Power Bandwidth H-Field Generator for Automatic Test Equipment.

, , , , , , , , , and . DFT, page 159-166. IEEE Computer Society, (2003)

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Reconfiguration of One-Time Programmable FPGAs with Faulty Logic Resources., , , and . DFT, page 368-376. IEEE Computer Society, (1999)A XOR-Tree Based Technique for Constant Testability of Configurable FPGAs., , , and . Asian Test Symposium, page 248-253. IEEE Computer Society, (1997)Measuring the timing jitter of ATE in the frequency domain., , , , , , , , , and . IEEE Trans. Instrumentation and Measurement, 55 (1): 280-289 (2006)Analysis and measurement of fault coverage in a combined ATE and BIST environment., , and . IEEE Trans. Instrumentation and Measurement, 53 (2): 300-307 (2004)Design Verification of FPGA Implementations., , , , and . IEEE Design & Test of Computers, 16 (2): 66-73 (1999)Maximal diagnosis of interconnects of random access memories., , , and . IEEE Trans. Reliability, 52 (4): 423-434 (2003)Sequential diagnosis of processor array systems., , , and . IEEE Trans. Reliability, 53 (4): 487-498 (2004)A Digital and Wide Power Bandwidth H-Field Generator for Automatic Test Equipment., , , , , , , , , and . DFT, page 159-166. IEEE Computer Society, (2003)Test generation and scheduling for layout-based detection of bridge faults in interconnects., , , and . IEEE Trans. VLSI Syst., 7 (1): 48-55 (1999)Structural diagnosis of interconnects by coloring., , and . ACM Trans. Design Autom. Electr. Syst., 3 (2): 249-271 (1998)