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Reliability challenges for copper low-k dielectrics and copper diffusion barriers.

, , und . Microelectronics Reliability, 45 (9-11): 1436-1442 (2005)

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Di Liu University of Stuttgart

Data for: The silicon vacancy centers in SiC: determination of intrinsic spin dynamics for integrated quantum photonics. Dataset, (2024)Related to: Di Liu, Florian Kaiser, Vladislav Bushmakin, Erik Hesselmeier, Timo Steidl, Takeshi Ohshima, Nguyen Tien Son, Jawad Ul-Hassan, Öney O. Soykal, Jörg Wrachtrup (2023). The silicon vacancy centers in SiC: determination of intrinsic spin dynamics for integrated quantum photonics. arXiv preprint. arXiv: 2307.13648.
 

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