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Disambiguation of "Li, Y.-L."

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Layout dependency induced deviation from Poisson area scaling in BEOL dielectric reliability.

, , , , and . Microelectronics Reliability, 45 (9-11): 1299-1304 (2005)

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To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Annika Liebgott

Automated reference-free assessment of MR image quality using an active learning approach: Comparison of Support Vector Machine versus Deep Neural Network classification, , , , , , , and . Proceedings of the International Society for Magnetic Resonance in Medicine (ISMRM), Honolulu, Hawaii, USA, (April 2017)
Automated reference-free assessment of MR image quality using an active learning approach: Comparison of Support Vector Machine versus Deep Neural Network classification, , , , , , , and . Proceedings of the International Society for Magnetic Resonance in Medicine (ISMRM), Honolulu, Hawaii, USA, (April 2017)An easy-to-use image labeling platform for automatic Magnetic Resonance Image Quality Assessment, , , , , , and . Proceedings of the IEEE International Symposium on Biomedical Imaging (ISBI), Melbourne, Australia, (April 2017)Automated image quality assessment in whole-body MRI, , , , , , , , and . Proceedings of the Radiological Society of North America (RSNA), Chicago, USA, (November 2016)

Di Liu University of Stuttgart

Data for: The silicon vacancy centers in SiC: determination of intrinsic spin dynamics for integrated quantum photonics. Dataset, (2024)Related to: Di Liu, Florian Kaiser, Vladislav Bushmakin, Erik Hesselmeier, Timo Steidl, Takeshi Ohshima, Nguyen Tien Son, Jawad Ul-Hassan, Öney O. Soykal, Jörg Wrachtrup (2023). The silicon vacancy centers in SiC: determination of intrinsic spin dynamics for integrated quantum photonics. arXiv preprint. arXiv: 2307.13648.

M. Liewald

Yiwen Liao University of Stuttgart

Mingaile Litinskaite University of Stuttgart

 

Other publications of authors with the same name

Rutgers' HARD Track Experiences at TREC 2004., , , , , , , , , and 1 other author(s). TREC, Special Publication 500-261, National Institute of Standards and Technology (NIST), (2004)Rutgers Information Interaction Lab at TREC 2005: Trying HARD., , , , , , , , , and . TREC, Special Publication 500-266, National Institute of Standards and Technology (NIST), (2005)Reliability challenges for copper low-k dielectrics and copper diffusion barriers., , and . Microelectronics Reliability, 45 (9-11): 1436-1442 (2005)Delayed response of snails' vertical distribution on the bottomland to the changing water level at the downstream area of the Three Gorges project., , , , and . Ecological Informatics, (2015)Layout dependency induced deviation from Poisson area scaling in BEOL dielectric reliability., , , , and . Microelectronics Reliability, 45 (9-11): 1299-1304 (2005)Constructing a community of practice to improve coursework activity., , and . Computers & Education, 50 (1): 235-247 (2008)Standardising vulnerability categories., , and . Computers & Security, 27 (3-4): 71-83 (2008)Matching Algorithm for Real-time Switches to Improve the Schedulable Ratio., , , , and . JCM, 14 (8): 662-668 (2019)Tensor based robust color face recognition., , , and . ICPR, page 1719-1722. IEEE Computer Society, (2012)Face recognition using various scales of discriminant color space transform., , , , and . Neurocomputing, (2012)