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Disambiguation of "Roussel, Philippe"

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Layout dependency induced deviation from Poisson area scaling in BEOL dielectric reliability.

, , , , and . Microelectronics Reliability, 45 (9-11): 1299-1304 (2005)

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Jun. -Prof. Dr. Philippe Grönquist University of Stuttgart

 

Other publications of authors with the same name

Stochastic Modeling of Hot-Carrier Degradation in nFinFETs Considering the Impact of Random Traps and Random Dopants., , , , , , , , , and 1 other author(s). ESSDERC, page 262-265. IEEE, (2019)A brief overview of gate oxide defect properties and their relation to MOSFET instabilities and device and circuit time-dependent variability., , , , , , , , , and 4 other author(s). Microelectronics Reliability, (2018)Analytic variability study of inference accuracy in RRAM arrays with a binary tree winner-take-all circuit for neuromorphic applications., , , , , , and . ESSDERC, page 62-65. IEEE, (2018)Method to assess the impact of LER and spacing variation on BEOL dielectric reliability using 2D-field simulations for <20nm spacing., , , , , and . IRPS, page 10-1. IEEE, (2018)Yield prediction for architecture exploration in nanometer technology nodes: : a model and case study for memory organizations., , , , and . CODES+ISSS, page 253-258. ACM, (2006)The defect-centric perspective of device and circuit reliability - From individual defects to circuits., , , , , , , , , and 5 other author(s). ESSDERC, page 218-225. IEEE, (2015)Exponent Monte Carlo for Quick Statistical Circuit Simulation., , , , and . PATMOS, volume 5953 of Lecture Notes in Computer Science, page 36-45. Springer, (2009)Editing First-Order Proofs: Programmed Rules vs Derived Rules., , and . SLP, page 92-98. IEEE-CS, (1984)Variability aware modeling for yield enhancement of SRAM and logic., , , and . DATE, page 1153-1158. IEEE, (2011)Approximating Standard Cell Delay Distributions by Reformulating the Most Probable Failure Point., , , , and . ERMAVSS@DATE, volume 1566 of CEUR Workshop Proceedings, page 13-16. CEUR-WS.org, (2016)