%0 Conference Paper %1 sharma2022characterization %A Sharma, Kanuj %A Kamm, Simon %A Munoz Baron, Kevin %A Kallfass, Ingmar %B 2022 24th European Conference on Power Electronics and Applications (EPE'22 ECCE Europe) %D 2022 %I IEEE %K mult ubs_10005 ubs_20007 ubs_30076 ubs_30175 ubs_40346 ubs_40357 unibibliografie wos %T Characterization of Online Junction Temperature of the SiC power MOSFET by Combination of Four TSEPs using Neural Network %@ 978-90-75815-39-9 and 978-1-66548-700-9

@inproceedings{sharma2022characterization, adddress = {Piscataway, NJ}, added-at = {2023-09-26T15:43:53.000+0200}, affiliation = {Sharma, K (Corresponding Author), Univ Stuttgart, Inst Robust Power Semicond Syst, Stuttgart, Germany. Sharma, Kanuj; Baron, Kevin Munoz; Kallfass, Ingmar, Univ Stuttgart, Inst Robust Power Semicond Syst, Stuttgart, Germany. Kamm, Simon, Univ Stuttgart, Inst Automat & Software Syst, Stuttgart, Germany.}, author = {Sharma, Kanuj and Kamm, Simon and Munoz Baron, Kevin and Kallfass, Ingmar}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2988b11c59c1e74831fff4e6f36e754a8/unibiblio}, booktitle = {2022 24th European Conference on Power Electronics and Applications (EPE'22 ECCE Europe)}, eventdate = {2022-09-05/2022-09-09}, eventtitle = {24th European Conference on Power Electronics and Applications (EPE ECCE Europe)}, interhash = {966dc1bd97b3f4a53f656638c23cf2c1}, intrahash = {988b11c59c1e74831fff4e6f36e754a8}, isbn = {{978-90-75815-39-9} and {978-1-66548-700-9}}, keywords = {mult ubs_10005 ubs_20007 ubs_30076 ubs_30175 ubs_40346 ubs_40357 unibibliografie wos}, language = {eng}, publisher = {IEEE}, series = {European Conference on Power Electronics and Applications}, timestamp = {2023-09-26T15:43:53.000+0200}, title = {Characterization of Online Junction Temperature of the SiC power MOSFET by Combination of Four TSEPs using Neural Network}, unique-id = {WOS:000886231604004}, venue = {Hannover}, year = 2022 }